- The first table refers to the Scanning Electron Microscope – SEM (Jeol6380LV)
- The second table refers to the Transmission Electron Microscope – ΤEM (Jeol 2100 HR, 200kV, TEM)
- The third table refers to the X-ray Diffractometer- XRD (Bruker D8 Focus)
- The fourth table refers to the Hydraulic Fatigue (Instron 8800)
- The fifth table refers to the Raman Spectrometer